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Equotip 550 (platform only) Highly robust and advanced measuring system

Hardness Testing

Equotip 550 (platform only)

Highly robust and advanced measuring system

  • Swiss quality, accuracy, and reliability combined with powerful software features
  • World's broadest selection of probes and conversion tables
  • A fully rugged casing and long-lasting probes

Applications:

Hardness testing of casts, flanges, shafts, and bars/pipes / Near-line Quality Control / Heat-treated surfaces

The highest accuracy, durability, and functionality from the inventor of the Leeb method
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Reliability
The unmatched lifespan of probes and impact bodies, lasting four times longer than others on the market.
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Productivity
Comes with the most complete probe portfolio, the broadest material conversion tables including Proceq's own research and world's widest standard conversion.
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User Experience
Ready-to-go reports through powerful built-in reporting feature, along with fully customizable views, multiple wizards, and material selection assistant.
Equotip 550 (platform only) Tech Specs
Instrument
Tech Specs
Native Scale
HLx (x: D, DC, DL, S, E, G, C)
Available Scales
HB, HV, HRA, HRB, HRC, HS, MPA (σ1, σ2, σ3)
Available Probes
Leeb D / DC / DL / S / E / G / C
Combination With Other Methods
Portable Rockwell, UCI
Average Roughness Ra (µm / µinch)
7 / 275 (Leeb G)
Minimum Mass (kg / lbs)
0.02 / 0.045 (Leeb C)
Minimum Thickness (mm / inch)
1 / 0.04 (Leeb C)
Instrument Firmware
Automatic compensation for impact direction
Personalized user profiles and views
Integration in automated testing environments (incl. remote control)
11 Languages and timezone supported
Measurement wizards
Custom curve wizard
Combined method wizard
User guidance features
Custom report features
Custom conversion curves
Yes, 1-point shift, 2-point, polynomial
Pc Software
Equotip Link allowing direct reporting and custom reports
Display
7” color rugged touchscreen unit (800 x 480 pixels) with dual core processor
Memory
Internal 8 GB flash memory (> 1’000’000 measurements)
Connections
USB host / device and Ethernet
Verification according to
ISO 16859, ASTM A 956, custom method, combined method
Measuring Range
150 - 950 HL
Protection
IP54, fully rugged with shock-absorbing casing
Measuring Accuracy
± 4 HL (0.5% at 800 HL)
Coefficient of variation
± 4 HL (0.5% at 800 HL)
PDF Version
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Standards & Guidelines

Standards

  • Arrow, click names to download Standards & Guidelines ASTM A 370
  • Arrow, click names to download Standards & Guidelines ASTM A 956
  • Arrow, click names to download Standards & Guidelines ASTM E 140
  • Arrow, click names to download Standards & Guidelines DIN 50156
  • Arrow, click names to download Standards & Guidelines GB/T 17394
  • Arrow, click names to download Standards & Guidelines ISO 16859
  • Arrow, click names to download Standards & Guidelines ISO 18265
  • Arrow, click names to download Standards & Guidelines JB/T 9378

Guidelines

  • Arrow ASME CRTD-91
  • Arrow DGZfP Guideline MC 1
  • Arrow Nordtest Technical Reports 424-1, 424-2, 424-3
  • Arrow VDI / VDE Guideline 2616 Paper 1
FAQ
What parameters are important when choosing the right Leeb probe?

Minimal mass of the tested piece
Minimum requirements for the surface roughness (and corresponding time)
Sample accessibility
Materials microstructure (coarser grains are preferably measured by the probes with higher...

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What Leeb probe has the lowest impact energy?

It is Probe type C with 3 Nmm (vs. 11 nMm for probe D), its suitable for surface-treated materials or small objects, however it must fulfill the requirements specified by the standards and by Proceq.

Is Equotip Leeb easy to use?

Yes, very easy and has very high repeatability. The exception is a DL probe, which has presumably higher inertia due to the elongated impact body and unstable base of the probe. Due to this, the probe is known to be...

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Can small objects be investigated with Leeb?

Yes, but only if they follow the requirements specified by Proceq. Samples can be measured as coupled and uncoupled.

The wall thickness and mass of the test object can influence hardness testing according to Leeb or UCI....

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How to extend the UCI Probe's longevity?
  • NEVER impact the surface with the probe, it may damage the diamond tip
  • NEVER slide the probe along the surface after initiating a penetration, it may damage the diamond tip
  • Regular service and verification in service...
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